Course detail

Methods of Structure Analysis II

FSI-WA2 Acad. year: 2025/2026 Winter semester

Supervisor

Ing. Ondřej Man, Ph.D.

Department

Institute of Materials Science and Engineering

Learning outcomes of the course unit

Prerequisites

Planned learning activities and teaching methods

Assesment methods and criteria linked to learning outcomes

Language of instruction

Czech

Aims

Specification of controlled education, way of implementation and compensation for absences

The study programmes with the given course

Programme N-MTI-P: Materials Engineering, Master's
branch ---: no specialisation, 5 credits, compulsory-optional

Programme C-AKR-P: , Lifelong learning
branch CZS: , 5 credits, elective

Type of course unit

 

Lecture

26 hours, optionally

Teacher / Lecturer

Ing. Pavel Doležal, Ph.D.
Ing. Ondřej Man, Ph.D.

Syllabus

Following nominal order of topics is subject to changes according to opportunities in organizing the practical lessons:
- macroscopic analytical techniques (introduction)
- optical emission spectroscopy (OES)
- atomic absorption spectroscopy (AAS)
- combustion analysers C, N, O, H
- microscopy and spectroscopy of Auger electrons
- secondary ion mass spectroscopy (SIMS)
- X-ray photoelectron spectroscopy (XPS)
- Raman and infrared spectroscopy (FTIR)
- scanning probe microscopy (STM, AFM, SNOM)
- combined micro- and spectroscopic methods (TERS, SERS)
- advanced X-ray diffraction and scattering techniques (SAXS, GISAXS, X-ray topography, synchrotrons)
- neutron diffraction
- Mössbauer spectroscopy
- measurement of magnetic properties of materials
- X-ray tomography, micro- and nano-tomography
- destructive tomography techniques (3D FIB)

Laboratory exercise

26 hours, compulsory

Teacher / Lecturer

Ing. Pavel Doležal, Ph.D.
Ing. Ondřej Man, Ph.D.

Syllabus

Following nominal order of topics is subject to changes according to opportunities in organizing the practical lessons:
- optical emission spectroscopy (OES), atomic absorption spectroscopy (AAS), combustion analysers C, N, O, H
- microscopy and spectroscopy of Auger electrons, secondary ion mass spectroscopy (SIMS), X-ray photoelectron spectroscopy (XPS)
- Raman and infrared spectroscopy (FTIR), scanning probe microscopy (STM, AFM, SNOM)
- advanced X-ray diffraction and scattering techniques
- Mössbauer spectroscopy, measurement of magnetic properties of materials
- X-ray tomography, micro- and nano-tomography, destructive tomography techniques (3D FIB)