Publication detail
Normalized Testability Measures Based on RTL Digital Circuit Graph Model Analysis
STRNADEL, J.
Czech title
Normalizované míry testovatelnosti založené na analýze grafového modelu RTL číslicového obvodu
English title
Normalized Testability Measures Based on RTL Digital Circuit Graph Model Analysis
Type
article in a collection out of WoS and Scopus
Language
en
Original abstract
The paper presents measures for testability valuation of a digital circuit at register-transfer level (RT level, RTL). Definition of a graph model of a RTL digital circuit for these purposes and mathematical formulas of measures for testability valuation based on analysis of proposed graph model are presented in this paper. Finally, experimental results are presented.
Czech abstract
Článek prezentuje míry pro ohodnocení testovatelnosti založené na analýze grafového modelu RTL číslicového obvodu. V článku je představen grafový model RTL číslicového obvodu, vztahy pro ohodnocení testovatelnosti a dosažené experimentální výsledky.
English abstract
The paper presents measures for testability valuation of a digital circuit at register-transfer level (RT level, RTL). Definition of a graph model of a RTL digital circuit for these purposes and mathematical formulas of measures for testability valuation based on analysis of proposed graph model are presented in this paper. Finally, experimental results are presented.
Keywords in English
Register transfer level, digital circuit graph model, testability analysis measures
Released
01.09.2002
Publisher
The University of Technology Košice
Location
Košice
ISBN
80-7099-879-2
Book
Proceedings of The fifth International Scientific Conference Electronic Computers and Informatics 2002
Pages from–to
200–205
Pages count
6
BIBTEX
@inproceedings{BUT10247,
author="Josef {Strnadel},
title="Normalized Testability Measures Based on RTL Digital Circuit Graph Model Analysis",
booktitle="Proceedings of The fifth International Scientific Conference Electronic Computers and Informatics 2002",
year="2002",
month="September",
pages="200--205",
publisher="The University of Technology Košice",
address="Košice",
isbn="80-7099-879-2"
}