Publication detail
Scattermeter for measurements of solar cells
NÁDASKÝ, P. ŠUSTEK, Š. KLUS, J. OHLÍDAL, M. VODÁK, J.
English title
Scattermeter for measurements of solar cells
Type
Paper in proceedings (conference paper)
Language
en
Original abstract
Scattermeter II is the second generation device designed and built at The Institute of Physical Engineering, Faculty of Mechanical Engineering, Brno University of Technology. This device has been designed for measuring the angular distribution of the intensity of electromagnetic radiation scattered from a surface of a solid. In this paper, the basic scheme of Scattermeter II and measuring principles with it are described. The results achieved in electromagnetic radiation scattering from surfaces of selected samples of single crystalline silicon wafers used in solar cells are also presented.
Keywords in English
Scattermeter, scattering of electromagnetic radiation, solar cells
Released
2015-09-07
ISBN
9781628418170
ISSN
0277-786X
Book
Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V
Journal
Proceedings of SPIE
Number
9628
Pages from–to
96280–96288
Pages count
8
BIBTEX
@inproceedings{BUT116777,
author="Pavel {Nádaský} and Štěpán {Šustek} and Jakub {Klus} and Miloslav {Ohlídal} and Jiří {Vodák}",
title="Scattermeter for measurements of solar cells",
booktitle="Optical Systems Design 2015: Optical Fabrication, Testing, and Metrology V",
year="2015",
journal="Proceedings of SPIE",
number="9628",
pages="96280--96288",
doi="10.1117/12.2190779",
isbn="9781628418170",
issn="0277-786X"
}