Publication detail

In situ synchrotron X-ray diffraction analysis of two-way shape memory effect in Nitinol

WANG, Z. ZHANG, Y. LIOGAS, K. CHEN, J. VUGHAN, G. KOCICH, R. KUNČICKÁ, L. UZUN, F YOU, Z KORSUNSKY, A

English title

In situ synchrotron X-ray diffraction analysis of two-way shape memory effect in Nitinol

Type

WoS Article

Language

en

Original abstract

Despite the fact that the Two-Way Shape Memory Effect (TWSME) has been demonstrated in most Shape Memory Alloys, the effective application of this unique functional behaviour is hindered by the lack of a proper training methodology and understanding of its mechanisms. In this study, a novel training routine has been established together with a home-designed device, enabling TWSME of customised spline curvature to be produced. An in situ high energy synchrotron X-ray diffraction experiment has been performed on Nitinol, followed by comprehensive analysis to reveal the micromechanics of TWSME. Multiple mainstream hypotheses have been examined. The important findings are: (1) The training process has negligible influence on the texture of parent phase; (2) The preferred variant of the B19’ phase exhibits tension/compression asymmetry in TWSME; (3) (100) compound twin is the preferred deformation mode for compression TWSME; (4) The mesoscale residual strain field is the dominant factor that induces TWSME; (5) Lattice defects (dislocations) are spatially rearranged after training; (6) Compression TWSME training retards the B2 to B19’ transformation, whilst tension has the opposite effect. The implications of these findings are further discussed.

Keywords in English

Two-way shape memory effectIn situ synchrotron X-ray diffractionNitinolMicromechanics

Released

2023-06-01

Publisher

ELSEVIER SCIENCE INC

ISSN

0921-5093

Volume

878

Number

145226

Pages count

12

BIBTEX


@article{BUT184111,
  author="WANG, Z. and ZHANG, Y. and LIOGAS, K. and CHEN, J. and VUGHAN, G. and KOCICH, R. and KUNČICKÁ, L. and UZUN, F and YOU, Z and KORSUNSKY, A",
  title="In situ synchrotron X-ray diffraction analysis of two-way shape memory effect in Nitinol",
  journal="MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING",
  year="2023",
  volume="878",
  number="145226",
  pages="12",
  doi="10.1016/j.msea.2023.145226",
  issn="0921-5093",
  url="https://www.sciencedirect.com/science/article/pii/S0921509323006500"
}