Publication detail

Measuring and prognosis of remaining useful life of light-emitting diodes based on nonlinear fuzzy inference system

LA, Q. VALIS, D. VINTR, Z. GAJEWSKI, J. ŽÁK, L. KOHL, Z.

English title

Measuring and prognosis of remaining useful life of light-emitting diodes based on nonlinear fuzzy inference system

Type

WoS Article

Language

en

Original abstract

Measuring and predicting the remaining useful life (RUL) of products and engineering systems is crucial for effective health monitoring and maintenance planning. The key challenges in RUL prediction lie in acquiring relevant health indicators and constructing accurate predictive models based on these indicators. However, direct health indicator data that reflect product degradation are not always accessible; in some cases, only indirect informative measurements are available. This article addresses such a scenario with light-emitting diodes (LEDs). The article focuses on finding a feasible approach to RUL prediction using a non-linear fuzzy inference system (FIS). We introduce an optimization/training framework that integrates Bayesian optimization, multiobjective genetic algorithms, regression techniques, and F-Test feature selection to estimate the model's structural and operational parameters effectively. Online RUL prediction and parameter adaptation are achieved through the approaches based on the particle filter (PF), Huber likelihood, and recursive least squares (RLS) methods. The proposed methodology demonstrates promising predictive performance, enabling the prediction of RUL based on available indirect measurements.

Keywords in English

Light-emitting diode, Reliability, Remaining useful life, Non-linear fuzzy inference system, Data structural change, Rule selection, Online prediction

Released

2026-01-07

Journal

MEASUREMENT

Volume

264

Number

January 2026

Pages from–to

333–355

Pages count

23

BIBTEX


@article{BUT200675,
  author="{} and  {} and  {} and  {} and Libor {Žák} and  {}",
  title="Measuring and prognosis of remaining useful life of light-emitting diodes based on nonlinear fuzzy inference system",
  journal="MEASUREMENT",
  year="2026",
  volume="264",
  number="January 2026",
  pages="333--355",
  doi="10.1016/j.measurement.2026.120322",
  issn="0263-2241",
  url="https://doi.org/10.1016/j.measurement.2026.120322"
}