Publication detail

Design of Compact Vacuum Setup for Al+and Ca+Ion Trapping with Homogeneous Magnetic Field

GRIM, J. VLČEK, I. JEDLIČKA, P. PHAM, M. ŘĚRUCHA, S. ČIŽEK, M. KOVALENKO, A. SLODIČKA, L. ČÍP, O.

English title

Design of Compact Vacuum Setup for Al+and Ca+Ion Trapping with Homogeneous Magnetic Field

Type

Paper in proceedings (conference paper)

Language

en

Original abstract

We present our arrangement of new apparatus for trapping Ca+ and Al+ ions. The apparatus consists of a compact vacuum chamber, linear quadrupole trap, one pair of Helmholtz coils, two pairs of saddle coils, and a magnetic shield. The new design respects the requirement of the large optical access for laser beam integration, a homogeneous magnetic field in the position of the ion in the trapping area, and an ultra-high vacuum regime to avoid interactions between residual gas and ions. The new apparatus is designed in a way so that all important subparts can be changed easily and allow us to minimize the time when the inner parts are exposed to the air during a component exchange. All parts of the arrangement, including the quadrupole trap, have been designed and developed by the Institute of Scientific Instruments in Brno, Czech Republic.

Keywords in English

aluminium ions | calcium ions | homogeneous magnetic field | Ion trap | vacuum chamber

Released

2023-01-01

Publisher

Institute of Electrical and Electronics Engineers Inc.

ISBN

9798350311426

Book

Proceedings 2023 Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium Eftf Ifcs 2023

Pages count

4

BIBTEX


@inproceedings{BUT200819,
  author="Jakub {Grim} and  {} and  {} and  {} and  {} and  {} and  {} and  {} and  {}",
  title="Design of Compact Vacuum Setup for Al+and Ca+Ion Trapping with Homogeneous Magnetic Field",
  booktitle="Proceedings 2023 Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium Eftf Ifcs 2023",
  year="2023",
  pages="4",
  publisher="Institute of Electrical and Electronics Engineers Inc.",
  doi="10.1109/EFTF/IFCS57587.2023.10272116",
  isbn="9798350311426"
}