Spectral Computed Tomography Based on Semi-Monochromatic Imaging

Peer-reviewed article not indexed in WoS or Scopus

en

Spectral computed tomography (CT) advances conventional CT by enabling material-specific imaging. This technique leverages the energy dependence of X-ray attenuation. However, the polychromatic spectra typical for laboratory and industrial CT limit the sensitivity of spectral CT methods. In this work, band-pass filtering of X-ray energies in a laboratory CT scanner is explored for the purpose of increasing spectral sensitivity. In the Rigaku nano3DX, X-ray generation is tuned to maximize the fraction of characteristic X-rays in the overall energy spectrum. This fraction is further enhanced by strategic filtering and processing of CT datasets to produce semi-monochromatic images centered on characteristic emission lines relevant to the analysis. Reconstructed CTdata can then be interpreted as linear attenuation coefficients for the given emission line in the scanned volume, with potential for further spectral and spectroscopic applications in a laboratory setting, particularly for low-Z materials.

Spectral computed tomography, Dual-energy CT, X-ray Filtration, Semi-monochromatic imaging, X-ray spectra, Material identification, Characteristic X-ray radiation

2026-03-01

E-Journal of Nondestructive Testing

E-Journal of nondestructive testing

31

3

9