Publication detail
Acquisition of the Angular Distribution of Backscattered Electrons in the Scanning Low Energy Electron Microscope.
MÜLLEROVÁ, I. KONVALINA, I. POKORNÁ, Z.
English title
Acquisition of the Angular Distribution of Backscattered Electrons in the Scanning Low Energy Electron Microscope.
Type
Paper in proceedings (conference paper)
Language
en
Original abstract
New eight-channel detector for acquisition of the angular distribution of backscattered electrons has been designed and tested. The detector is based on a multi-channel plate followed by eight concentric circular collectors centered to the optical axis. High collection efficiency and high amplification of the detector down to 100 eV of emission energy is secured by action of the cathode lens. In first experiments the detector has proved itself useful for imaging of polycrystalline structures.
Keywords in English
multi-channel detector, angular distribution, low energy electron microscope
Released
2006-09-11
Location
Toyama
ISBN
4-9903248-0-3
Book
6th Japanese-Polish Joint Seminar on Materials Analysis
Pages from–to
13–
Pages count
2
BIBTEX
@inproceedings{BUT21728,
author="Ilona {Müllerová} and Ivo {Konvalina} and Zuzana {Pokorná}",
title="Acquisition of the Angular Distribution of Backscattered Electrons in the Scanning Low Energy Electron Microscope.",
booktitle="6th Japanese-Polish Joint Seminar on Materials Analysis",
year="2006",
pages="2",
address="Toyama",
isbn="4-9903248-0-3"
}