Publication detail

High resolution time-of-flight low energy ion scattering

DRAXLER, M. MARKIN, S. KOLÍBAL, M. PRŮŠA, S. ŠIKOLA, T. BAUER, P.

English title

High resolution time-of-flight low energy ion scattering

Type

Peer-reviewed article not indexed in WoS or Scopus

Language

en

Original abstract

Low energy ion scattering (LEIS) is a well known technique for quantitative composition and structure analysis. Two different detection methods can be used in a LEIS experiment, i.e. an electrostatic analyzer or a time-of-flight (TOF) spectrometer. Both techniques have specific advantages. Nevertheless, the time-of-flight technique surpasses usual electrostatic analyzers used in LEIS in terms of energy resolution.The possibility to measure ions and neutrals, and the better energy resolution permit to study neutralization or charge exchange processes in much more detail. Here we present a TOF LEIS setup with an energy resolution of better than 0.4% for 3 keV He ions and report experimental results for 3 keV He ions backscattered from a polycrystalline Cu target. The resulting ion spectrum shows interesting inherent features, which are analyzed. Possible causes for the appearance of these features are discussed.

Keywords in English

High resolution; TOF; LEIS; He; Cu

Released

2005-04-15

Publisher

Elsevier

ISSN

0168-583X

Journal

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

Volume

230

Pages from–to

398–401

Pages count

4

BIBTEX


@article{BUT45588,
  author="M. {Draxler} and S. N. {Markin} and Miroslav {Kolíbal} and Stanislav {Průša} and Tomáš {Šikola} and P. {Bauer}",
  title="High resolution time-of-flight low energy ion scattering",
  journal="NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS",
  year="2005",
  volume="230",
  number="0",
  pages="398--401",
  issn="0168-583X"
}