Publication detail

Optical characterization of absorbing thin films non-uniform in thickness using imaging spectroscopic reflectometry

OHLÍDAL, M. OHLÍDAL, I. KLAPETEK, P.

English title

Optical characterization of absorbing thin films non-uniform in thickness using imaging spectroscopic reflectometry

Type

Abstract

Language

en

Original abstract

Application of the imaging spectroscopic reflectometry to the optical characterization of non-uniform absorbing carbon-nitride thin films is presented. It is possible to determine the area distribution of the optical constants of the non-uniform films together with their thickness distribution using this technique.

Keywords in English

Absorbing thin films, optical parameters

Released

2008-07-07

Publisher

International Commission for Optics

Location

Sydney

Pages from–to

50–50

Pages count

1

BIBTEX


@misc{BUT60549,
  author="Miloslav {Ohlídal} and Ivan {Ohlídal} and Petr {Klapetek}",
  title="Optical characterization of absorbing thin films non-uniform in thickness using imaging spectroscopic reflectometry",
  year="2008",
  pages="50--50",
  publisher="International Commission for Optics",
  address="Sydney",
  note="Abstract"
}