Publication detail

AFM – a Tool for a Study of Surfaces, Micro- and Nanostructures.

LOPOUR, F. ŠIKOLA, T. ŠKODA, D.

English title

AFM – a Tool for a Study of Surfaces, Micro- and Nanostructures.

Type

Paper in proceedings (conference paper)

Language

en

Original abstract

Atomic force microscopy (AFM) has become a powerful tool for studies of topography of solids and micro/nanostructures. In the contribution the design principles and applications of an AFM microscope developed at the institute will be presented. Particularly, the results of experiments carried out on thin films, micro- and nanostructures will be discussed. Additionally, nanostructures fabricated by AFM will be shown as well.

Released

2001-06-27

Publisher

Vutium

Location

Brno

ISBN

80-214-1892-3

Book

Materials Structure & Micromechanics of Fracture (MSMF-3)

Pages from–to

394–

Pages count

6

BIBTEX


@inproceedings{BUT6291,
  author="Filip {Lopour} and Tomáš {Šikola} and David {Škoda}",
  title="AFM - a Tool for a Study of Surfaces, Micro- and Nanostructures.",
  booktitle="Materials Structure & Micromechanics of Fracture (MSMF-3)",
  year="2001",
  pages="6",
  publisher="Vutium",
  address="Brno",
  isbn="80-214-1892-3"
}