Publication detail

Noncontact Scanning Force Microscopy – Principles and Simulations

KALOUSEK, R. ŠIKOLA, T. BUŠ, V. ŠKODA, D.

English title

Noncontact Scanning Force Microscopy – Principles and Simulations

Type

Paper in proceedings (conference paper)

Language

en

Original abstract

In the contribution, some fundamental phenomena in noncontact Scanning Force Microscopy (SFM) are studied. In this technique, the surface profile is measured by changes of resonance frequency of the vibrating cantilever. In the first part, the basic principles of noncontact SFM are described. Simulations of a tip moving and oscillating over a silicon atomic structure will be discussed in the second part.

Released

2001-11-15

Publisher

FEI VUT v Brně

Location

Brno

ISBN

80-214-1992-X

Book

Sborník příspěvků konference Nové trendy ve fyzice

Pages from–to

369–

Pages count

6

BIBTEX


@inproceedings{BUT6498,
  author="Radek {Kalousek} and Tomáš {Šikola} and Vladan {Buš} and David {Škoda}",
  title="Noncontact Scanning Force Microscopy - Principles and Simulations",
  booktitle="Sborník příspěvků konference Nové trendy ve fyzice",
  year="2001",
  pages="6",
  publisher="FEI VUT v Brně",
  address="Brno",
  isbn="80-214-1992-X"
}