Publication detail
The Behavior of Surface Roughness in EHL Contacts Under Small Slide to Roll Ratios
ŠPERKA, P. KŘUPKA, I. HARTL, M.
English title
The Behavior of Surface Roughness in EHL Contacts Under Small Slide to Roll Ratios
Type
WoS Article
Language
en
Original abstract
The amplitude attenuation theory represents a possible way how to predict the tribological performance of a surface having general roughness. There are applications of this theory for pure rolling and rolling–sliding conditions having different governing parameters. Obviously, pure rolling case is much simpler and it was already experimentally verified. Conversely, rolling–sliding conditions represent much complex case and its solution is still under development. Nevertheless, a lot of machine components operate under the conditions where only small slide to roll ratios are present. This study was carried out to find the reasonable validity of the pure rolling model for the applications where small amount of sliding is present. The behavior of roughness was observed under conditions of small sliding speed using optical tribometer for film thickness mapping. The results were analyzed and compared with the predictions according the amplitude attenuation theory for both pure rolling and rolling–sliding cases. It was concluded that the purerolling model can be applied with reasonable precision within the range of slide to roll ratios from -0.15 to 0.1. The correlation coefficient are better than 0.85, the RMS value changes are less than 3 %, and bearing area curves are almost unaffected.
Keywords in English
EHL film geometry; Surface roughness
Released
2012-06-10
Publisher
Springer
Location
EU
ISSN
1023-8883
Journal
Tribology letter
Volume
47
Number
3
Pages from–to
357–366
Pages count
10
BIBTEX
@article{BUT94591,
author="Petr {Šperka} and Ivan {Křupka} and Martin {Hartl}",
title="The Behavior of Surface Roughness in EHL Contacts Under Small Slide to Roll Ratios",
journal="Tribology letter",
year="2012",
volume="47",
number="3",
pages="357--366",
doi="10.1007/s11249-012-9993-9",
issn="1023-8883"
}