• Analysis of Roughness-Induced Shielding in Terms of Size Ratio Effect.

  Publication Year: 2003

  POKLUDA, J. ŠANDERA, P. HORNÍKOVÁ, J.

• Analysis of thin films by TOF LEIS

  Publication Year: 2003

  PRŮŠA, S., KOLÍBAL, M., BÁBOR, P., MACH, J., JURKOVIČ, P., ŠIKOLA, T.

• Application of a simple imaging system in SIMS and TOF LEIS

  Publication Year: 2003

  BÁBOR, P., KOLÍBAL, M., PRŮŠA, S., ŠIKOLA, T.

• Application of AFM in the field of nanostructure study and preparation

  Publication Year: 2003

  ŠKODA, D., LOPOUR, F., KALOUSEK, R., BURIAN, D., SPOUSTA, J., MATĚJKA, F., ŠIKOLA, T.

• Application of the Fresnel diffraction possessing zero intensity along two mutually perpendicular directions to straight line alignment

  Publication Year: 2003

  VELECHOVSKÝ, K. KOMRSKA, J.

• Autocorrelation function of sum of two spectrally decorrelated laser speckle fields - Comparison of Fresnel and Fraunhofer approximation

  Publication Year: 2003

  PRAŽÁK, D. OHLÍDAL, M.

• Beahviour of an optically trapped probe approaching a dielectric interface

  Publication Year: 2003

  JÁKL, P., ŠERÝ, M., JEŽEK, J., JONÁŠ, A., LIŠKA, M., ZEMÁNEK, P.

• Biaxial Fatigue of High-Strength Low-Alloy Steel.

  Publication Year: 2003

  NEMEŠ, R. SLÁMEČKA, K. POKLUDA, J.

• Calculations of Intensive Electron Source for Electron Beam Welding

  Publication Year: 2003

  JÁNSKÝ, P., LENCOVÁ, B., ZLÁMAL, J.

• Calculations of Intensive Electron Source for Electron Beam Welding

  Publication Year: 2003

  JÁNSKÝ, P. LENCOVÁ, B. ZLÁMAL, J.

• Deposition and in situ characterization of ultra-thin films

  Publication Year: 2003

  VOBORNÝ, S., KOLÍBAL, M., MACH, J., ČECHAL, J., BÁBOR, P., PRŮŠA, S., SPOUSTA, J., ŠIKOLA, T.

• Deposition of Cobalt Nitride Films by IBAD

  Publication Year: 2003

  VAIS, J. ŽENÍŠEK, J. MRÁZ, M. DITTRICHOVÁ, L. SPOUSTA, J. RAFAJA, D. ŠIKOLA, T.

• Digital laser holographic interference microscope

  Product Year: 2003

  OHLÍDAL, M. JÁKL, M. KRŠEK, J. LENK, J. ŠÍR, L.

• Digital laser speckle spectral correlation within the famework of the Fresnel approximation of the scalar Kirchhoff theory and its application in surface roughness measurement

  Publication Year: 2003

  OHLÍDAL, M., PRAŽÁK, D.

• Efficiency of Collection of the Secondary Electrons in SEM

  Publication Year: 2003

  KONVALINA, I. MÜLLEROVÁ I.

Showed 976–990 from 1303 results