Publication detail

Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM

NOVOTNÁ, V. HRUBANOVÁ, K. NEBESÁŘOVÁ, J. KRZYŽÁNEK, V.

English title

Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM

Type

Scopus Article

Language

en

Original abstract

Radiation damage of embedding media was investigated in low voltage scanning transmission electron microscope at energies 10-30 keV.

Keywords in English

STEM, mass loss, embedding media

Released

2014-08-10

ISSN

1431-9276

Journal

MICROSCOPY AND MICROANALYSIS

Volume

20

Number

S3

Pages from–to

1270–1271

Pages count

2

BIBTEX


@article{BUT109068,
  author="NOVOTNÁ, V. and HRUBANOVÁ, K. and NEBESÁŘOVÁ, J. and KRZYŽÁNEK, V.",
  title="Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM",
  journal="MICROSCOPY AND MICROANALYSIS",
  year="2014",
  volume="20",
  number="S3",
  pages="1270--1271",
  doi="10.1017/S1431927614008083",
  issn="1431-9276"
}