Detail publikace

Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM

NOVOTNÁ, V. HRUBANOVÁ, K. NEBESÁŘOVÁ, J. KRZYŽÁNEK, V.

Anglický název

Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM

Typ

Článek Scopus

Jazyk

en

Originální abstrakt

Radiation damage of embedding media was investigated in low voltage scanning transmission electron microscope at energies 10-30 keV.

Klíčová slova anglicky

STEM, mass loss, embedding media

Vydáno

2014-08-10

ISSN

1431-9276

Časopis

MICROSCOPY AND MICROANALYSIS

Ročník

20

Číslo

S3

Strany od–do

1270–1271

Počet stran

2

BIBTEX


@article{BUT109068,
  author="NOVOTNÁ, V. and HRUBANOVÁ, K. and NEBESÁŘOVÁ, J. and KRZYŽÁNEK, V.",
  title="Investigation of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM",
  journal="MICROSCOPY AND MICROANALYSIS",
  year="2014",
  volume="20",
  number="S3",
  pages="1270--1271",
  doi="10.1017/S1431927614008083",
  issn="1431-9276"
}