Publication detail
Analysis of thin films by TOF LEIS
PRŮŠA, S. KOLÍBAL, M. BÁBOR, P. MACH, J. JURKOVIČ, P. ŠIKOLA, T.
English title
Analysis of thin films by TOF LEIS
Type
Paper in proceedings (conference paper)
Language
en
Original abstract
Structural analysis using TOF LEIS.
Released
2003-06-23
Publisher
EVC
Location
Berlin
Book
EVC'03 Abstracts
Pages from–to
133–
Pages count
2
BIBTEX
@inproceedings{BUT11057,
author="Stanislav {Průša} and Miroslav {Kolíbal} and Petr {Bábor} and Jindřich {Mach} and Patrik {Jurkovič} and Tomáš {Šikola}",
title="Analysis of thin films by TOF LEIS",
booktitle="EVC'03 Abstracts",
year="2003",
pages="2",
publisher="EVC",
address="Berlin"
}