Publication detail

Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections

Radim Skoupy, Jana Nebesarova, Vladislav Krzyzanek

English title

Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections

Type

Peer-reviewed article not indexed in WoS or Scopus

Language

en

Released

2016-07-25

Publisher

Microscopy Society of America

ISSN

1431-9276

Journal

MICROSCOPY AND MICROANALYSIS

Volume

22

Pages from–to

926–927

Pages count

2

BIBTEX


@article{BUT127271,
  author="Radim {Skoupý} and Vladislav {Krzyžánek} and Jana {Nebesářová}",
  title="Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections",
  journal="MICROSCOPY AND MICROANALYSIS",
  year="2016",
  volume="22",
  pages="926--927",
  doi="10.1017/S143192761600547X",
  issn="1431-9276",
  url="http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=10423736&fulltextType=AB&fileId=S143192761600547X"
}