Detail publikace

Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections

Radim Skoupy, Jana Nebesarova, Vladislav Krzyzanek

Anglický název

Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections

Typ

Článek recenzovaný mimo WoS a Scopus

Jazyk

en

Vydáno

2016-07-25

Nakladatel

Microscopy Society of America

ISSN

1431-9276

Časopis

MICROSCOPY AND MICROANALYSIS

Ročník

22

Strany od–do

926–927

Počet stran

2

BIBTEX


@article{BUT127271,
  author="Radim {Skoupý} and Vladislav {Krzyžánek} and Jana {Nebesářová}",
  title="Electron Beam Induced Mass Loss Dependence on Stained Thin Epon Resin Sections",
  journal="MICROSCOPY AND MICROANALYSIS",
  year="2016",
  volume="22",
  pages="926--927",
  doi="10.1017/S143192761600547X",
  issn="1431-9276",
  url="http://journals.cambridge.org/action/displayAbstract?fromPage=online&aid=10423736&fulltextType=AB&fileId=S143192761600547X"
}