Conference on Optical Measurement Systems for Industrial Inspection XI held at SPIE Optical Metrology Symposium
English title
Conference on Optical Measurement Systems for Industrial Inspection XI held at SPIE Optical Metrology Symposium
Type
Holding a conference
Language
en
BIBTEX
@misc{BUT160886,
title="Conference on Optical Measurement Systems for Industrial Inspection XI held at SPIE Optical Metrology Symposium",
year="2019",
note="Holding a conference"
}