Conference on Optical Measurement Systems for Industrial Inspection XI held at SPIE Optical Metrology Symposium

English title

Conference on Optical Measurement Systems for Industrial Inspection XI held at SPIE Optical Metrology Symposium

Type

Holding a conference

Language

en

BIBTEX


@misc{BUT160886,
  title="Conference on Optical Measurement Systems for Industrial Inspection XI held at SPIE Optical Metrology Symposium",
  year="2019",
  note="Holding a conference"
}