Conference on Optical Measurement Systems for Industrial Inspection XI held at SPIE Optical Metrology Symposium
Anglický název
Conference on Optical Measurement Systems for Industrial Inspection XI held at SPIE Optical Metrology Symposium
Typ
Uspořádání (zorganizování) konference
Jazyk
en
BIBTEX
@misc{BUT160886,
title="Conference on Optical Measurement Systems for Industrial Inspection XI held at SPIE Optical Metrology Symposium",
year="2019",
note="Holding a conference"
}