Conference on Optical Measurement Systems for Industrial Inspection XI held at SPIE Optical Metrology Symposium

Anglický název

Conference on Optical Measurement Systems for Industrial Inspection XI held at SPIE Optical Metrology Symposium

Typ

Uspořádání (zorganizování) konference

Jazyk

en

BIBTEX


@misc{BUT160886,
  title="Conference on Optical Measurement Systems for Industrial Inspection XI held at SPIE Optical Metrology Symposium",
  year="2019",
  note="Holding a conference"
}