Publication detail

Prognoses and planning in metrology, and the predition application

VAČKÁŘ, J. BUMBÁLEK, L.

English title

Prognoses and planning in metrology, and the predition application

Type

Peer-reviewed article not indexed in WoS or Scopus

Language

en

Original abstract

One of the quantities which is monitored by the metrology of geometrical values is the structure appreciation of machined surfaces, particularly the shape of the surface profile. Spectral analysis of the surface profile is an important condition for prediction of functional properties of important component surfaces.

Released

2000-02-26

ISSN

2000-1213

Volume

28

Number

2

Pages from–to

269–

Pages count

6

BIBTEX


@article{BUT41054,
  author="Josef {Vačkář} and Leoš {Bumbálek}",
  title="Prognoses and planning in metrology, and the predition application",
  year="2000",
  volume="28",
  number="2",
  pages="6"
}