Detail publikace

Prognoses and planning in metrology, and the predition application

VAČKÁŘ, J. BUMBÁLEK, L.

Anglický název

Prognoses and planning in metrology, and the predition application

Typ

Článek recenzovaný mimo WoS a Scopus

Jazyk

en

Originální abstrakt

One of the quantities which is monitored by the metrology of geometrical values is the structure appreciation of machined surfaces, particularly the shape of the surface profile. Spectral analysis of the surface profile is an important condition for prediction of functional properties of important component surfaces.

Vydáno

2000-02-26

ISSN

2000-1213

Ročník

28

Číslo

2

Strany od–do

269–

Počet stran

6

BIBTEX


@article{BUT41054,
  author="Josef {Vačkář} and Leoš {Bumbálek}",
  title="Prognoses and planning in metrology, and the predition application",
  year="2000",
  volume="28",
  number="2",
  pages="6"
}