Publication detail

Surface profilometry by a holographic confocal microscopy

CHMELÍK, R. LOVICAR, L. HARNA, Z.

English title

Surface profilometry by a holographic confocal microscopy

Type

Peer-reviewed article not indexed in WoS or Scopus

Language

en

Original abstract

Confocal imaging by a holographic confocal microscope is based on the real-time incoherent holography. Besides the image amplitude, the image phase is inherently reconstructed. In this paper, we demonstrate that the phase image component can be converted into the height map of the specimen surface, and, in this way, we can measure the surface profile with the precision of several nanometers. The possible ambiguity in the height determination of large height steps is overcome owing to the depth discrimination property of the microscope. The axial resolution required for this purpose is achieved using broadband illumination.

Keywords in English

holography applications; profilometry; confocal microscopy.

Released

2003-01-01

ISSN

0078-5466

Journal

OPTICA APPLICATA

Volume

33

Number

2-3

Pages from–to

381–

Pages count

9

BIBTEX


@article{BUT41935,
  author="Radim {Chmelík} and Luděk {Lovicar} and Zdeněk {Harna}",
  title="Surface profilometry by a holographic confocal microscopy",
  journal="OPTICA APPLICATA",
  year="2003",
  volume="33",
  number="2-3",
  pages="9",
  issn="0078-5466"
}