Publication detail

Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries

OHLÍDAL, I. VIŽĎA, F. OHLÍDAL, M.

English title

Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries

Type

Peer-reviewed article not indexed in WoS or Scopus

Language

en

Keywords in English

Spectroscopic reflectometry, thin layers

Released

1995-06-01

ISSN

0091-3286

Journal

OPTICAL ENGINEERING

Volume

34

Number

6

Pages from–to

1761–

Pages count

8

BIBTEX


@article{BUT42984,
  author="Ivan {Ohlídal} and František {Vižďa} and Miloslav {Ohlídal}",
  title="Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries",
  journal="OPTICAL ENGINEERING",
  year="1995",
  volume="34",
  number="6",
  pages="8",
  issn="0091-3286"
}