Detail publikace

Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries

OHLÍDAL, I. VIŽĎA, F. OHLÍDAL, M.

Anglický název

Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries

Typ

Článek recenzovaný mimo WoS a Scopus

Jazyk

en

Klíčová slova anglicky

Spectroscopic reflectometry, thin layers

Vydáno

1995-06-01

ISSN

0091-3286

Časopis

OPTICAL ENGINEERING

Ročník

34

Číslo

6

Strany od–do

1761–

Počet stran

8

BIBTEX


@article{BUT42984,
  author="Ivan {Ohlídal} and František {Vižďa} and Miloslav {Ohlídal}",
  title="Optical analysis by means of spectroscopic reflectometry of single and double layers with correlated randomly rough boundaries",
  journal="OPTICAL ENGINEERING",
  year="1995",
  volume="34",
  number="6",
  pages="8",
  issn="0091-3286"
}