Publication detail

Multi-Channel Detection of the Angular Distribution of Backscattered Electrons in the Scanning Low Energy Electron Microscope.

MÜLLEROVÁ, I. KONVALINA I.

English title

Multi-Channel Detection of the Angular Distribution of Backscattered Electrons in the Scanning Low Energy Electron Microscope.

Type

Peer-reviewed article not indexed in WoS or Scopus

Language

en

Original abstract

The final image contrast in the scanning electron microscope (SEM) is not only a product of the interaction of primary electrons with the target, but the collection efficiency of the detector with its energy and angular distributions, as well as any subsequent signal processing, also play a role. In order to arrive at high signal-to-noise ratio, as many signal species should be caught as possible, though achieving a high contrast might require the selection of only a small part of the emission spectra. Multi-channel parallel detectors are promising in this respect.

Keywords in English

multi-channel detector, angular distribution, low energy electron microscope

Released

2006-07-30

ISSN

1431-9276

Journal

MICROSCOPY AND MICROANALYSIS

Volume

12

Number

2

Pages from–to

1438–

Pages count

2

BIBTEX


@article{BUT44384,
  author="Ilona {Müllerová} and Ivo {Konvalina}",
  title="Multi-Channel Detection of the Angular Distribution of Backscattered Electrons in the Scanning Low Energy Electron Microscope.",
  journal="MICROSCOPY AND MICROANALYSIS",
  year="2006",
  volume="12",
  number="2",
  pages="2",
  issn="1431-9276"
}