Publication detail
Optical characterization of multilayer systems with randomly rough boundaries
OHLÍDAL, M. OHLÍDAL, I. VIŽĎA, F.
English title
Optical characterization of multilayer systems with randomly rough boundaries
Type
Paper in proceedings (conference paper)
Language
en
Original abstract
The method based on measuring and interpeting the spectral dependences of the coherent reflectance is used to determine the values of the optical and statistical parameters of three-layer and thirteen-layer systems exhibiting the randomly rough boundaries. The systems mentioned are formed by thin films of SiO2 and TiO2.
Keywords in English
multilayer systems, spectroscopic reflectometry
Released
1999-08-02
Publisher
SPIE- The international Society for Optical Engine
Location
San Francisco, California, USA
ISBN
0-8194-3234-2
Book
18th Congress of the International Commission for Optics: Optics for the Next Millennium
Pages from–to
150–151
Pages count
2
BIBTEX
@inproceedings{BUT485,
author="Ivan {Ohlídal} and František {Vižďa} and Miloslav {Ohlídal}",
title="Optical characterization of multilayer systems with randomly rough boundaries",
booktitle="18th Congress of the International Commission for Optics: Optics for the Next Millennium",
year="1999",
series="1",
pages="150--151",
publisher="SPIE- The international Society for Optical Engine",
address="San Francisco, California, USA",
isbn="0-8194-3234-2"
}