Detail publikace
Optical characterization of multilayer systems with randomly rough boundaries
OHLÍDAL, M. OHLÍDAL, I. VIŽĎA, F.
Anglický název
Optical characterization of multilayer systems with randomly rough boundaries
Typ
Stať ve sborníku v databázi WoS či Scopus
Jazyk
en
Originální abstrakt
The method based on measuring and interpeting the spectral dependences of the coherent reflectance is used to determine the values of the optical and statistical parameters of three-layer and thirteen-layer systems exhibiting the randomly rough boundaries. The systems mentioned are formed by thin films of SiO2 and TiO2.
Klíčová slova anglicky
multilayer systems, spectroscopic reflectometry
Vydáno
1999-08-02
Nakladatel
SPIE- The international Society for Optical Engine
Místo
San Francisco, California, USA
ISBN
0-8194-3234-2
Kniha
18th Congress of the International Commission for Optics: Optics for the Next Millennium
Strany od–do
150–151
Počet stran
2
BIBTEX
@inproceedings{BUT485,
author="Ivan {Ohlídal} and František {Vižďa} and Miloslav {Ohlídal}",
title="Optical characterization of multilayer systems with randomly rough boundaries",
booktitle="18th Congress of the International Commission for Optics: Optics for the Next Millennium",
year="1999",
series="1",
pages="150--151",
publisher="SPIE- The international Society for Optical Engine",
address="San Francisco, California, USA",
isbn="0-8194-3234-2"
}