Publication detail

Analysis of Single Layers Placed on Slightly Rough Surfaces by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force

DRUCKMÜLLER, M. OHLÍDAL, I.

Czech title

Analysis of Single Layers Placed on Slightly Rough Surfaces by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force Microscopy

English title

Analysis of Single Layers Placed on Slightly Rough Surfaces by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force

Type

Chapter in a book

Language

cs

Released

1994-01-01

Publisher

JOHN WILEY AND SONS

Location

CHICHESTER

ISBN

0471978272

Book

ECASIA 97

Pages from–to

1051–

Pages count

4

BIBTEX


@inbook{BUT53494,
  author="Miloslav {Druckmüller} and Ivan {Ohlídal}",
  title="Analysis of Single Layers Placed on Slightly Rough Surfaces by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force Microscopy",
  booktitle="ECASIA 97",
  year="1994",
  publisher="JOHN WILEY AND SONS",
  address="CHICHESTER",
  pages="4",
  isbn="0471978272"
}