Detail publikace

Analysis of Single Layers Placed on Slightly Rough Surfaces by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force Microscopy

DRUCKMÜLLER, M. OHLÍDAL, I.

Český název

Analysis of Single Layers Placed on Slightly Rough Surfaces by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force Microscopy

Anglický název

Analysis of Single Layers Placed on Slightly Rough Surfaces by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force

Typ

Kapitola, resp. kapitoly v odborné knize

Jazyk

cs

Vydáno

1994-01-01

Nakladatel

JOHN WILEY AND SONS

Místo

CHICHESTER

ISBN

0471978272

Kniha

ECASIA 97

Strany od–do

1051–

Počet stran

4

BIBTEX


@inbook{BUT53494,
  author="Miloslav {Druckmüller} and Ivan {Ohlídal}",
  title="Analysis of Single Layers Placed on Slightly Rough Surfaces by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force Microscopy",
  booktitle="ECASIA 97",
  year="1994",
  publisher="JOHN WILEY AND SONS",
  address="CHICHESTER",
  pages="4",
  isbn="0471978272"
}