• Morphology and growth kinetics of organic thin films deposited by hot wall epitaxy on KCl substrates

  Publication Year: 2005

  ANDREEV, A. HABER, T. SMILGIES, D. RESEL, R. SITTER, H. SARICIFTCI, N. VÁLEK, L.

• Non-ablative capillary z-pinch for plasma-based waveguide

  Publication Year: 2005

  KAISER, J. –LIŠKA, M. –SAMEK, O. –EGRI, T. –RITUCCI, A. –REALE, A. –TOMASSETTI, G. –REALE, L. –PALLADINO, L. –KUKHLEVSKY, S.V. –FLORA, F. –MEZI, L. –FAENOV, A. –PIKUZ, T.

• On the Crack Closure Effect in Metallic Nanomaterials

  Publication Year: 2005

  POKLUDA, J. ŠANDERA, P.

• On the Crack Tip Shielding in Particle Reinforced Composites

  Publication Year: 2005

  HORNÍKOVÁ, J. ŠANDERA, P. POKLUDA, J.

• On the Crack Tip Shielding in Particle Reinforced Composites

  Publication Year: 2005

  HORNÍKOVÁ, J. ŠANDERA, P. POKLUDA, J. KOTOUL, M.

• Optical characterization of non-uniform thin films using imaging spectrophotometry

  Publication Year: 2005

  OHLÍDAL, M. ČUDEK, V. OHLÍDAL, I. KLAPETEK, P.

• Optical measurement of mechanical stresses in diamond-like carbon films

  Publication Year: 2005

  OHLÍDAL, I., FRANTA, D., ČUDEK, V., BURŠÍKOVÁ, V., KLAPETEK, P., JÁKL, M.

• Optical methods for evaluation of surface texture within micrometer region

  Publication Year: 2005

  OHLÍDAL, M.

• Optimization of Electron Welder Optics

  Publication Year: 2005

  JÁNSKÝ, P. LENCOVÁ, B. ZLÁMAL, J.

• Physical Support of Mechatronic Models

  Publication Year: 2005

  POKLUDA, J.

• Polychromatic coherent transfer function for a low-coherence interference microscope with achromatic fringes

  Publication Year: 2005

  CHMELÍK, R. LOVICAR, L. KOLMAN, P. SPOUSTA, J. FORET, Z.

• Potentialities of optical profilometer MicroProf FRT for surface quality measurement

  Publication Year: 2005

  PÁLENÍKOVÁ, K. OHLÍDAL, M.

• Sběrová účinnost ET detektoru sekundárních elektronů v REM.

  Publication Year: 2005

  KONVALINA, I. MÜLLEROVÁ, I.

• Simple Method for Estimation of Fatigue Loading and Useful Life from Fracture Morphology

  Publication Year: 2005

  POKLUDA, J. ŠANDERA, P.

• Stress measurement in thin layers with aid of combined optical method

  Publication Year: 2005

  OHLÍDAL, I., OHLÍDAL, M., FRANTA, D., ČUDEK, V., BURŠÍKOVÁ, V., ŠILER, M.

Showed 901–915 from 1307 results