• Collection Efficiency of the Detector of Secondary Electrons in SEM.

  Publication Year: 2004

  KONVALINA, I., MÜLLEROVÁ, I.

• Combining confocal light and scanning backscattered electron microscopic imaging of bone

  Publication Year: 2004

  BOYDE, A. LOVICAR, L. ZÁMEČNÍK, J.

• Control and stabilization wavelenght of Ti:Sa laser and experimental arrangement which is used for an optical pumping of atoms of Rubidium.

  Publication Year: 2004

  BUCHTA, Z., RYCHNOVSKÝ, J., LAZAR, J., BARTUŠEK, K.

• Control and stabilization wavelength of Ti:Sa laser which is used for an optical pumping of atoms of rubidium

  Publication Year: 2004

  ZDENĚK BUCHTA, JAN RYCHNOVSKÝ, JOSEF LAZAR

• Control of defects and gettering in Czochralski silicon

  Publication Year: 2004

  ŠIK, J. LORENC, M. VÁLEK, L.

• Deposition and in-situ charakterization of ultra-thin films

  Publication Year: 2004

  VOBORNÝ, S. KOLÍBAL, M. MACH, J. ČECHAL, J. BÁBOR, P. PRŮŠA, S. SPOUSTA, J. ŠIKOLA, T.

• Direct observation of the behaviour of the real surface roughness passing through EHD point contact

  Publication Year: 2004

  HARTL, M., LIŠKA, M.

• Economical helium bath cryopump: design and testing

  Publication Year: 2004

  MUSILOVÁ VĚRA, DUPÁK JAN, HANZELKA PAVEL, KRÁLÍK TOMÁŠ, URBAN PAVEL

• Elastic and magnetic stability of crystals under compression

  Publication Year: 2004

  ČERNÝ, M., POKLUDA, J.

• Experimental study of lubricant film thickness behavior in the vicinity of real asperities passing through lubricated contact

  Publication Year: 2004

  HARTL, M., FUIS, V., LIŠKA, M.

• Experimental Study of Real Asperities Behaviour within Lubricated Contacts

  Publication Year: 2004

  KŘUPKA, I., HARTL, M., LIŠKA, M.

• Fabrication of nanostructures on Si(100) and GaAs(100) by local anodic oxidation

  Publication Year: 2004

  KALOUSEK, R., ČERVENKA, J., BARTOŠÍK, M., ŠKODA, D., ŠIKOLA, T.

• Femtosecond laser analytical mass spectrometry applied to plant samples

  Publication Year: 2004

  SAMEK O, MARGETIC V, VON WIREN N, MICHELS A, NIEMAX K, HERGENRODER R

• Growth of gallium on sillicon: A TOF-LEIS and AFM study

  Publication Year: 2004

  KOLÍBAL, M., PRŮŠA, S., BÁBOR, P., BARTOŠÍK, M., TOMANEC, O., ŠIKOLA, T.

• Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy

  Publication Year: 2004

  FRANTA, D., OHLÍDAL, I., KLAPETEK, P.,OHLÍDAL, M.

Showed 931–945 from 1305 results