Detail publikace

Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry

NEČAS, D. VODÁK, J. OHLÍDAL, I. OHLÍDAL, M. MAJUMDAR, A. ZAJÍČKOVÁ, L.

Anglický název

Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry

Typ

Článek WoS

Jazyk

en

Originální abstrakt

A least-squares data fitting procedure is developed for the analysis of measurements of thin films non-uniform in thickness by imaging spectroscopic reflectometry. It solves the problem of simultaneous least-squares fitting of film thicknesses in all image pixels together with shared dispersion model parameters. Since the huge number of mutually correlated fitting parameters prevents a straightforward application of the standard Levenberg–Marquardt algorithm, the presented procedure exploits the special structure of the specific least-squares problem. The free parameters are split into thicknesses and dispersion model parameters. Both groups of parameters are fitted alternately, utilising an unmodified Levenberg–Marquardt algorithm, correcting however the thicknesses during the dispersion model fitting step to preserve effective optical thicknesses. The behaviour of the algorithm is studied using experimental data of two highly non-uniform thin films of different materials, SiOxCyHz and CNx:H, and by numerical simulations using artificial data. It is found that the optical thickness correction enables the procedure to converge rapidly, permitting the analysis of large imaging spectroscopic reflectometry data sets with reasonable computational resources.

Klíčová slova anglicky

Imaging spectrophotometry; Thin films; Optical properties; Thickness mapping; Non-linear least-squares; Levenberg–Marquardt

Vydáno

2015-01-23

Nakladatel

Applied Surface Science

ISSN

0169-4332

Časopis

APPLIED SURFACE SCIENCE

Číslo

350

Strany od–do

149–155

Počet stran

7

BIBTEX


@article{BUT115038,
  author="David {Nečas} and Jiří {Vodák} and Ivan {Ohlídal} and Miloslav {Ohlídal} and Abhijit {Majumdar} and Lenka {Zajíčková}",
  title="Simultaneous determination of dispersion model parameters and local thickness of thin films by imaging spectrophotometry",
  journal="APPLIED SURFACE SCIENCE",
  year="2015",
  number="350",
  pages="149--155",
  doi="10.1016/j.apsusc.2015.01.093",
  issn="0169-4332",
  url="http://www.sciencedirect.com/science/article/pii/S016943321500118X"
}