Detail publikace

Electron beam induced mass loss dependence on aging of epon resin sections

Skoupy R. Krzyzanek V. Kocova L. Nebesarova, J.

Anglický název

Electron beam induced mass loss dependence on aging of epon resin sections

Typ

Abstrakt

Jazyk

en

Klíčová slova anglicky

STEM, Epon, mass-loss

Vydáno

2015-08-23

Místo

Eger

Kniha

ABSTRACTS 12th Multinational Congress on Microscopy

Strany od–do

112–113

Počet stran

599

BIBTEX


@misc{BUT116391,
  author="Skoupy R. and Krzyzanek V. and Kocova L. and Nebesarova, J.",
  title="Electron beam induced mass loss dependence on aging of epon resin sections",
  booktitle="ABSTRACTS 12th Multinational Congress
on Microscopy",
  year="2015",
  pages="112--113",
  address="Eger",
  note="Abstract"
}