Detail publikace
Electron beam induced mass loss dependence on aging of epon resin sections
Skoupy R. Krzyzanek V. Kocova L. Nebesarova, J.
Anglický název
Electron beam induced mass loss dependence on aging of epon resin sections
Typ
Abstrakt
Jazyk
en
Klíčová slova anglicky
STEM, Epon, mass-loss
Vydáno
2015-08-23
Místo
Eger
Kniha
ABSTRACTS 12th Multinational Congress on Microscopy
Strany od–do
112–113
Počet stran
599
BIBTEX
@misc{BUT116391,
author="Skoupy R. and Krzyzanek V. and Kocova L. and Nebesarova, J.",
title="Electron beam induced mass loss dependence on aging of epon resin sections",
booktitle="ABSTRACTS 12th Multinational Congress
on Microscopy",
year="2015",
pages="112--113",
address="Eger",
note="Abstract"
}