Detail publikace

MEASUREMENT UNCERTAINTY SIMULATION BY MONTE CARLO METHOD IN NANOMETROLOGY

ŠRÁMEK, J. JANKOVÝCH, R.

Anglický název

MEASUREMENT UNCERTAINTY SIMULATION BY MONTE CARLO METHOD IN NANOMETROLOGY

Typ

Článek WoS

Jazyk

en

Originální abstrakt

This paper deals with the determination of uncertainty and individual contributions to the measurement uncertainty on the CMM SIOS NNM-1 instrument fitted with the touch-probe scanning system Gannen XP. Manufacturer SIOS designates this machine as nano-CMM. Two non-simulation methods to determine the measurement uncertainty, the substitution and multi-position methods are addressed in detail [Sramek, Jankovych 2018]. Ruby balls with various nominal diameters are used as the measured objects. One simulation method to determine the measurement uncertainty, the Monte Carlo method, is also addressed in this paper. The paper also summarizes and specifies calculation methods to determine the measurement uncertainty, and provides results of representative sets of measurements, including determination of the expanded measurement uncertainty. This paper contains novel conclusions in the area of uncertainty measurement of nano-CMMs.

Klíčová slova anglicky

accuracy of measurement, length measurement, measurement repeatability, measurement reproducibility, measurement uncertainty, measuring device, nanometrology, ruby ball

Vydáno

2019-10-01

Nakladatel

Modern Machinery (MM) Science Journal

Místo

ČR

ISSN

1805-0476

Časopis

MM Science Journal

Ročník

Oct 2019

Číslo

3

Strany od–do

2998–3004

Počet stran

6

BIBTEX


@article{BUT162066,
  author="Jan {Šrámek} and Róbert {Jankových}",
  title="MEASUREMENT UNCERTAINTY SIMULATION BY MONTE CARLO METHOD IN NANOMETROLOGY",
  journal="MM Science Journal",
  year="2019",
  volume="Oct 2019",
  number="3",
  pages="2998--3004",
  doi="10.17973/MMSJ.2019\{_}10\{_}2018112",
  issn="1803-1269",
  url="https://www.mmscience.eu/journal/issues/October%202019/articles/measurement-uncertainty-simulation-by-monte-carlo-method-in-nanometrology"
}