Detail publikace

Determination of thicknesses and spectral dependences of refractive indices of non-absorbing and weakly absorbing thin films using the wavelengths related to extrema in spectral reflectances

OHLÍDAL, I. FRANTA, D. OHLÍDAL, M. NAVRÁTIL, K.

Anglický název

Determination of thicknesses and spectral dependences of refractive indices of non-absorbing and weakly absorbing thin films using the wavelengths related to extrema in spectral reflectances

Typ

Článek recenzovaný mimo WoS a Scopus

Jazyk

en

Originální abstrakt

A new efficient modication of the method enabling us to perform the optical characterization of non-absorbing and weakly absorbing thin films without using the absolute values of reflectances measured is presented. This modification is based on determining the values of the wavelengths corresponding to the points where the spectral dependences of reflectances of studied films measured for several angles of incidence touch the envelopes of maxima and minima of these spectral dependences. Using a simple formula containing the wavelengths mentioned one can evaluate the values of the thicknesses and spectral dependences of the refractive indices of the films analyzed.

Klíčová slova anglicky

Thin films, Spectral reflectance, Optical parameters

Vydáno

2001-01-01

ISSN

0042-207X

Časopis

Vacuum

Ročník

61

Číslo

1

Strany od–do

285–289

Počet stran

5

BIBTEX


@article{BUT39658,
  author="Ivan {Ohlídal} and Daniel {Franta} and Miloslav {Ohlídal} and Karel {Navrátil}",
  title="Determination of thicknesses and spectral dependences of refractive indices of non-absorbing and weakly absorbing thin films using the wavelengths related to extrema in spectral reflectances",
  journal="Vacuum",
  year="2001",
  volume="61",
  number="1",
  pages="285--289",
  doi="10.1016/S0042-207X(01)00132-4",
  issn="0042-207X"
}