Detail publikace

A new program for the design of electron microscopes

LENCOVÁ, B. ZLÁMAL, J.

Anglický název

A new program for the design of electron microscopes

Typ

Článek recenzovaný mimo WoS a Scopus

Jazyk

en

Originální abstrakt

The paper describes the basic features of a new program EOD (Electron Optical Design), primarily intended for the design of systems of electron lenses and deflectors for scanning and transmission electron microscopes. A very accurate first-order finiteelement method in graded topologically regular meshes provides the fields. Electron optical properties can be analyzed from standard paraxial trajectories and aberration integrals for combined lens and deflection systems or, for a general system, from the results of very accurate ray-tracing. The advantage of EOD is that it includes a user-friendly interface, simplifying the output of results and the whole design procedure. EOD is used by undergraduate and postgraduate students at ISI and TU Brno.

Klíčová slova anglicky

Finite element method; Electron lenses and deflectors; Computer-aided design; User interface

Vydáno

2008-08-29

Nakladatel

Elsevier

ISSN

1875-3892

Časopis

Physics Procedia

Ročník

1

Číslo

1

Strany od–do

315–324

Počet stran

10

BIBTEX


@article{BUT48562,
  author="Bohumila {Lencová} and Jakub {Zlámal}",
  title="A new program for the design of electron microscopes",
  journal="Physics Procedia",
  year="2008",
  volume="1",
  number="1",
  pages="315--324",
  issn="1875-3892"
}