Detail publikace

Application of FIB technique to study of early fatigue damage in polycrystals

MAN, J. WEIDNER, A. KUBĚNA, I. VYSTAVĚL, T. SKROTZKI, W. POLÁK, J.

Anglický název

Application of FIB technique to study of early fatigue damage in polycrystals

Typ

Článek recenzovaný mimo WoS a Scopus

Jazyk

en

Originální abstrakt

Focused ion beam (FIB) technique together with other advanced microscopic techniques were applied to study early microstructural changes leading to crack initiation in fatigued polycrystals. Dislocation structures of persistent slip bands (PSBs) and surrounding matrix were revealed in the bulk of surface grains by electron channelling contrast imaging (ECCI) technique on the FIB cross-sections. True shape of extrusions, intrusions and the path of initiated fatigue cracks were assessed in three dimensions by serial FIB cross-sectioning (FIB tomography). Advantageous potential of FIB technique and its other possible utilization in fatigue crack initiation studies in polycrystals are highlighted.

Klíčová slova anglicky

focused ion beam, fatigue crack initiation, extrusion, intrusion

Vydáno

2010-08-09

ISSN

1742-6588

Časopis

Journal of Physics: Conference Series

Ročník

240

Číslo

1

Strany od–do

1–4

Počet stran

4

BIBTEX


@article{BUT49784,
  author="Jiří {Man} and Anja {Weidner} and Ivo {Kuběna} and Tomáš {Vystavěl} and Werner {Skrotzki} and Jaroslav {Polák}",
  title="Application of FIB technique to study of early fatigue damage in polycrystals",
  journal="Journal of Physics: Conference Series",
  year="2010",
  volume="240",
  number="1",
  pages="1--4",
  issn="1742-6588"
}