Detail publikace
HRTEM and EELS of nanoantenna structures fabricated using focused ion beam techniques
KOH, A. TOMANEC, O. URBÁNEK, M. ŠIKOLA, T. MAIER, S. MCCOMB, D.
Anglický název
HRTEM and EELS of nanoantenna structures fabricated using focused ion beam techniques
Typ
Článek recenzovaný mimo WoS a Scopus
Jazyk
en
Originální abstrakt
This paper describes the use of focused ion beam (FIB) techniques to fabricate Au nanoantenna structures for plasmonics applications. High-resolution transmission electron microscopy (HRTEM), diffraction and electron energy-loss spectroscopy (EELS) techniques are applied to investigate the structures of the initially patterned film, fabricated nanoantenna structures, and to map localized surface plasmon resonance (LSPR) modes in the nanostructures.
Klíčová slova anglicky
HRTEM; EELS; FIB; Plasmonics
Vydáno
2010-08-09
ISSN
1742-6588
Časopis
Journal of Physics: Conference Series
Ročník
241
Číslo
1
Strany od–do
012041-1–012041-4
Počet stran
4