Detail publikace
X-RAY MICROANALYSIS IN ESEM AND LV SEM
AUTRATA, R. JIRÁK, J. ŠPINKA, J.
Anglický název
X-RAY MICROANALYSIS IN ESEM AND LV SEM
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
en
Originální abstrakt
This article presents the advantageous metod for the X-ray microanalysis in ESEM which enables to assess the true specimen composition via mesurement of 4 or 5 values of the counts per second for different pressures.
Anglický abstrakt
This article presents the advantageous metod for the X-ray microanalysis in ESEM which enables to assess the true specimen composition via mesurement of 4 or 5 values of the counts per second for different pressures.
Klíčová slova anglicky
X-ray microanalysis, ESEM, LV SEM,
Rok RIV
2002
Vydáno
08.07.2002
Nakladatel
Institute of Scientific Instruments Academy of Sciences of the Czech republic, Czechoslovak Microscopy Society
Místo
Czech republic, Brno
ISBN
80-238-8986-9
Kniha
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation
Počet stran
2
BIBTEX
@inproceedings{BUT5198,
author="Rudolf {Autrata} and Josef {Jirák} and Jiří {Špinka},
title="X-RAY MICROANALYSIS IN ESEM AND LV SEM",
booktitle="Recent Trends in Charged Particle Optics and Surface Physics Instrumentation",
year="2002",
month="July",
publisher="Institute of Scientific Instruments Academy of Sciences of the Czech republic,
Czechoslovak Microscopy Society
",
address="Czech republic, Brno",
isbn="80-238-8986-9"
}