Detail publikace

Development of the program EOD for design in electron and ion microscopy

ZLÁMAL, J. LENCOVÁ, B.

Anglický název

Development of the program EOD for design in electron and ion microscopy

Typ

Článek recenzovaný mimo WoS a Scopus

Jazyk

en

Originální abstrakt

The paper surveys new features of the EOD program, a complete workplace for the design of electron and ion microscopes. The extensions of the program for space charge computations, interaction with gases in the specimen chamber and misalignments are handled as plug-ins, keeping the program as a single unit. The current status of the tolerancing plug-in is described in more detail.

Klíčová slova anglicky

Finite elementmethod; Tolerancing; User interface

Vydáno

2011-07-21

ISSN

0168-9002

Časopis

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT

Ročník

645

Číslo

1

Strany od–do

278–282

Počet stran

5

BIBTEX


@article{BUT72696,
  author="Jakub {Zlámal} and Bohumila {Lencová}",
  title="Development of the program EOD for design in electron and ion microscopy",
  journal="NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT",
  year="2011",
  volume="645",
  number="1",
  pages="278--282",
  issn="0168-9002"
}