Detail publikace

The Trajectories of Secondary Electrons in the Scanning Electron Microscope.

KONVALINA, I. MÜLLEROVÁ, I.

Anglický název

The Trajectories of Secondary Electrons in the Scanning Electron Microscope.

Typ

Článek recenzovaný mimo WoS a Scopus

Jazyk

en

Originální abstrakt

Three-dimensional simulations of the trajectories of secondary electrons (SE) in the scanning electron microscope have been performed for plenty of real configurations of the specimen chamber, including all its basic components. The primary purpose was to evaluate the collection efficiency of the Everhart-Thornley detector of SE and to reveal fundamental rules for tailoring the set-ups in which efficient signal acquisition can be expected. Intuitive realizations about the easiness of attracting the SEs towards the biased front grid of the detector have shown themselves as likely false, and all grounded objects in the chamber have been proven to influence the spatial distribution of the signal-extracting field. The role of the magnetic field penetrating from inside the objective lens is shown to play an ambiguous role regarding possible support for the signal collection.

Klíčová slova anglicky

ET detector, secondary electrons, collection efficiency

Vydáno

2006-01-11

ISSN

0161-0457

Časopis

SCANNING

Ročník

28

Číslo

5

Strany od–do

245–

Počet stran

12

BIBTEX


@article{BUT44381,
  author="Ivo {Konvalina}",
  title="The Trajectories of Secondary Electrons in the Scanning Electron Microscope.",
  journal="SCANNING",
  year="2006",
  volume="28",
  number="5",
  pages="12",
  issn="0161-0457"
}