Results of Research and Development
Analysis of thin films by TOF LEIS
Publication results Year: 2003
PRŮŠA, S., KOLÍBAL, M., BÁBOR, P., MACH, J., JURKOVIČ, P., ŠIKOLA, T.
Fabrication of Nanostructures by AFM
Publication results Year: 2003
ŠKODA, D., KALOUSEK, R., BARTOŠÍK, M., MATUROVÁ, K., ŠIKOLA, T.
TOF-LEIS analysis of ultra thin films: Ga- and Ga-N layer growth on Si (111)
Publication results Year: 2003
KOLÍBAL, M., PRŮŠA, S., BÁBOR, P., BAUER, P., ŠIKOLA, T.
Application of a simple imaging system in SIMS and TOF LEIS
Publication results Year: 2003
BÁBOR, P., KOLÍBAL, M., PRŮŠA, S., ŠIKOLA, T.
Noncontact Atomic Force Microscopy - Simulated Images of Real Surface Structures
Publication results Year: 2003
KALOUSEK, R., ŠKODA, D., ŠIKOLA, T.
Instrument for Thin Films Diagnostics by UV Spectroscopic Reflectometry
Publication results Year: 2003
URBÁNEK, M., SPOUSTA, J., NAVRÁTIL, K., FIEDOR, M., CHMELÍK, R., BUČEK, M., ŠIKOLA, T.
In-situ analysis of PMPSI by spectroscopic ellipsometry and XPS
Publication results Year: 2003
ČECHAL, J., TICHOPÁDEK, P., NEBOJSA, A., BONAVENTUROVÁ - ZRZAVECKÁ, O., URBÁNEK, M., NAVRÁTIL, K., ŠIKOLA, T.
Interface and depth profile analysis of magnetic ultrathin films
Publication results Year: 2003
VAIS, J., ŽENÍŠEK, J., JURKOVIČ, P., ČECHAL, J., DITTRICHOVÁ, L., SPOUSTA, J., BOCHNÍČEK, Z., ŠIKOLA, T.
Showed 226–240 from 1961 results