Results of Research and Development
Comparison of AFM and optical methods at measuring nanometric surface roughness
Publication results Year: 1998
OHLÍDAL, I., FRANTA, D., OHLÍDAL, M., VIČAR, M., KLAPETEK, P.
Comparison of optical and non-optical methods for measuring surface roughness
Publication results Year: 1999
OHLÍDAL, I., OHLÍDAL, M., FRANTA, D., TYKAL, M.
New ways of observing optical inhomogeneities in glass
Publication results Year: 1999
OHLÍDAL, M., VRÁNA, J., MICHÁLEK, A., PRAŽÁK, D., JÁKL, M., OHLÍDAL, I.
Acquisition of the Angular Distribution of Backscattered Electrons in the Scanning Low Energy Electron Microscope.
Publication results Year: 2006
MÜLLEROVÁ, I. KONVALINA, I. POKORNÁ, Z.
Factors affecting the Collection Efficiency of Secondary Electrons in SEM.
Publication results Year: 2005
KONVALINA, I. MÜLLEROVÁ, I.
Influence of magnetic and electrostatic fields in the specimen vicinity on trajectories of secondary electrons in SEM.
Publication results Year: 2004
KONVALINA, I. MÜLLEROVÁ, I. FRANK, L.
The collection efficiency of the Everhart-Thornley detector of secondary electrons in SEM.
Publication results Year: 2004
KONVALINA, I. MÜLLEROVÁ, I. FRANK, L.
A method for objective quantification of the efficiency of electron detectors.
Publication results Year: 2004
FRANK, L. MÜLLEROVÁ, I. NOVÁK, L. HORÁČEK, M. KONVALINA, I.
Showed 406–420 from 1961 results