• Imaging of the expansion of femtosecond-laser-produced silicon plasma atoms by off-resonant planar laser-induced fluorescence

  Publication results Year: 2003

  Samek O, Leis F, Margetic V, Malina R, Niemax K, Hergenroder R

• Optical characterization of diamond-like carbon thin films non-uniform in thickness using spectroscopic reflectometry

  Publication results Year: 2008

  OHLÍDAL, I. NEČAS, D. BURŠÍKOVÁ, V. FRANTA, D. OHLÍDAL, M.

• Ab initio analysis of theoretical isotropic strength and elasticity of nickel aluminide compounds

  Publication results Year: 2004

  ČERNÝ, M. POKLUDA, J. ŠANDERA, P.

• Stability of FCC crystals under hydrostatic loading

  Publication results Year: 2004

  ČERNÝ, M. POKLUDA, J.

• ToF-LEIS Analysis of ultra thin films: Ga and Ga-N layer growth on Si(111)

  Publication results Year: 2004

  KOLÍBAL, M. PRŮŠA, S. BÁBOR, P. ŠIKOLA, T.

• Deposition and in-situ charakterization of ultra-thin films

  Publication results Year: 2004

  VOBORNÝ, S. KOLÍBAL, M. MACH, J. ČECHAL, J. BÁBOR, P. PRŮŠA, S. SPOUSTA, J. ŠIKOLA, T.

• In situ analysis of PMPSi by spectroscopic ellipsometry and XPS

  Publication results Year: 2004

  ČECHAL, J. TICHOPÁDEK, P. NEBOJSA, A. BONAVENTUROVÁ, O. URBÁNEK, M. SPOUSTA, J. NAVRÁTIL, K. ŠIKOLA, T.

• Instrument for thin film diagnostics by UV spectroscopic reflectometry

  Publication results Year: 2004

  URBÁNEK, M. SPOUSTA, J. NAVRÁTIL, K. SZOTKOWSKI, R. CHMELÍK, R. BUČEK, M. ŠIKOLA, T.

• In situ analysis of PMPSi thin films by spectroscopic ellipsometry

  Publication results Year: 2004

  BRANDEJSOVÁ, E. ČECHAL, J. BONAVENTUROVÁ, O. NEBOJSA, A. TICHOPÁDEK, P. URBÁNEK, M. NAVRÁTIL, K. ŠIKOLA, T. HUMLÍČEK, J.

Showed 796–810 from 1961 results